und über 1,5 Millionen weitere Bücher verfügbar für Amazon Kindle. Erfahren Sie mehr

Loggen Sie sich ein, um 1-Click® einzuschalten.
Mit kostenloser Probeteilnahme bei Amazon Prime. Melden Sie sich während des Bestellvorgangs an.
Jetzt eintauschen
und EUR 5,00 Gutschein erhalten
Alle Angebote
Möchten Sie verkaufen? Hier verkaufen
Der Artikel ist in folgender Variante leider nicht verfügbar
Keine Abbildung vorhanden für
Keine Abbildung vorhanden

Beginnen Sie mit dem Lesen von Handbook of Sample Preparation for Scanning Electron Micr... auf Ihrem Kindle in weniger als einer Minute.

Sie haben keinen Kindle? Hier kaufen oder eine gratis Kindle Lese-App herunterladen.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis [Englisch] [Gebundene Ausgabe]

Patrick Echlin

Statt: EUR 93,60
Jetzt: EUR 93,36 kostenlose Lieferung. Siehe Details.
  Alle Preisangaben inkl. MwSt.
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
Nur noch 2 auf Lager (mehr ist unterwegs).
Verkauf und Versand durch Amazon. Geschenkverpackung verfügbar.
Lieferung bis Montag, 22. September: Wählen Sie an der Kasse Morning-Express. Siehe Details.

Weitere Ausgaben

Amazon-Preis Neu ab Gebraucht ab
Kindle Edition EUR 63,11  
Gebundene Ausgabe EUR 93,36  
Taschenbuch EUR 96,29  


22. April 2009 0387857303 978-0387857305 2009
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Hinweise und Aktionen

  • Studienbücher: Ob neu oder gebraucht, alle wichtigen Bücher für Ihr Studium finden Sie im großen Studium Special. Natürlich portofrei.

  • Englische Fachbücher: jetzt reduziert - Entdecken Sie passend zum Semesterstart bis zum 15. November 2014 ausgewählte englische Fachbücher. Klicken Sie hier, um direkt zur Aktion zu gelangen.

Wird oft zusammen gekauft

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis + Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
Preis für beide: EUR 167,06

Die ausgewählten Artikel zusammen kaufen

Kunden, die diesen Artikel gekauft haben, kauften auch




This handbook should find its way to the reference bookshelf of all imaging laboratories. It should also become required reading for anyone being trained for SEM work, or anyone who might need to have their samples examined by using such techniques. In that way, it will be less likely that deficient results will be published and that the full potential of the SEM be realized. -- Iolo ap Gwynn, Microscopy and Microanalysis (2010)


This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. While the Handbook complements the best-selling textbook, "Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition", by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument.Photomicrographs of each specimen complement the many sample preparation 'recipes'. Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This authoritative yet practical handbook is an essential reference for anyone who uses these instruments, and assumes only an elementary knowledge of preparation techniques to guide the reader through the specific protocols.

Welche anderen Artikel kaufen Kunden, nachdem sie diesen Artikel angesehen haben?

In diesem Buch (Mehr dazu)
Scanning electron microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. Lesen Sie die erste Seite
Ausgewählte Seiten ansehen
Buchdeckel | Copyright | Inhaltsverzeichnis | Auszug | Stichwortverzeichnis
Hier reinlesen und suchen:


Es gibt noch keine Kundenrezensionen auf Amazon.de
5 Sterne
4 Sterne
3 Sterne
2 Sterne
1 Sterne
Die hilfreichsten Kundenrezensionen auf Amazon.com (beta)
Amazon.com: 4.0 von 5 Sternen  1 Rezension
2 von 2 Kunden fanden die folgende Rezension hilfreich
4.0 von 5 Sternen Useful volume with poor production 28. März 2011
Von xyz - Veröffentlicht auf Amazon.com
The volume covers current sample preparation for SEM and X-ray analysis. The range of topics covered is extensive, from the standard procedures to rather esoteric methods (see index in sample pages provided on Amazon). The various topics are quite extensively referenced, and this review of the previously published literature is the second main benefit of the volume. The writing is mostly clear and to the point, as would be expected from a scientific volume. This book is useful to have in the EM laboratory as a reference to explore preparation of new sample types, or to point new investigators to familiarize themselves with some options of sample preparation. It makes a good companion volume to Goldstein and the VP volume by Stokes (highly recommended).

The author in parts is scientifically über-politically correct, to the point of being a hindrance. He likes to indicate temperature in Kelvin. Preparations to be carried out at 277K then actually refer to 4C, which would be the much more sensible way to talk about laboratory procedures. On the other hand, pressures are both indicated in Pascal as well as in non-SI Torr. Irritating, but can be dealt with by any scientist.

The sources for equipment and supplies is quite useful, though the provider index in Microscopy and Analysis will be more current. I did miss Fine Science Tools in the tools section.

The production of the volume can only be termed sloppy, and not fit for a Springer Verlag label. There are numerous instances where micro meters are not shown as mu-m but as mm (millimeters) or u-m. While such typos are immediately apparent to the seasoned microscopist, students could easily be confused. Mid-line hyphens, missing periods and alike should also have been taken care of. Many of the illustrations seem to be lifted from low resolution web-site images, with pixellation showing in print.
Ist diese Rezension hilfreich?   Wir wollen von Ihnen hören.

Kunden diskutieren

Das Forum zu diesem Produkt
Diskussion Antworten Jüngster Beitrag
Noch keine Diskussionen

Fragen stellen, Meinungen austauschen, Einblicke gewinnen
Neue Diskussion starten
Erster Beitrag:
Eingabe des Log-ins

Kundendiskussionen durchsuchen
Alle Amazon-Diskussionen durchsuchen

Ähnliche Artikel finden

Ihr Kommentar